Accepted Papers

The section containing accepted papers prior to their appearance in the forthcoming issues of Materials Science-Poland, is available on: Ahead of Print Articles.

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The Hydrogenation Process of the Gd₃Ni Compound

N.V.Tristan¹, T. Palewski¹, H. Drulis², L. Folcik², S.A. Nikitin^1,3
1International Laboratory of High Magnetic Fields and Low Temperatures, Wrocław, Poland
²Institute of Low Temperatures and Structure Research, Wrocław, Poland
³Faculty of Physics, Moscow State University, Vorobievy Gory, Russia

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Semiconductor Heterostructures and Device Structures Investigated By Photoreflectance Spectroscopy

J. Misiewicz, P. Sitarek, G. Sęk, R. Kudrawiec
Institute of Physics, Wrocław University of Technology, Poland

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Combined SNOM/AFM Microscopy with Micromachined Nanoapertures

J. Radojewski¹, P. Grabiec^2
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
²Institute of Electron Technology, Warsaw, Poland

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Thermal Characterization of Copper Thin Films Made by Means of Sputtering

R.F. Szeloch, W.M. Posadkowski, T.P. Gotszalk, P.Janus, T. Kowaliw
Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland

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Application of Electrostatic Force Microscopy in Nanosystem Diagnostics

T.P. Gotszalk¹, P. Grabiec², I.W. Rangelow^3
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
²Institute of Electron Technology, Warsaw, Poland
³Institute of Technological Physics, University of Kassel, Germany

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Wavelet Shrinkage-based Noise Reduction From The High Resolution X-ray Images of Epitaxial Layers

J. Kozłowski¹, J. Serafińczuk¹, A. Kozik^2
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
²Institute of Engineering Cybernetics, Wrocław University of Technology, Poland

Abstract

This paper presents advantages of employing the wavelet method in X-ray high-resolution image analysis of nanostructures. It is shown that many more details of the structure examined can be distin-guished in rocking curves (RC) as well as in reciprocal space maps (RSM) after application of the numerical procedure. The method proposed seems to be particularly suitable for imperfect epitaxial layers having significant lattice mismatch with respect to substrate. By means of the wavelet analysis of the X-ray images using de-noising procedure details invisible in raw pictures can be detected such as thickness fringes, gradient of lattice parameters etc., and duration of measurements can be shortened.

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